The Artic TC series of temperature controlled wafer chucks are used for test and characterization of semiconductor wafers and other components at hot and cold temperatures.

Several models are available with temperature ranges from -65 degrees C to + 400 degrees C. Chucks are available in 4,6,8 and 12 inch diameters. These systems offer several design features which provide excellent performance to meet the most demanding customer applications.

Trio-Tech provides full turn-key solutions for wafer probing at hot and cold temperatures including triaxial guarding, rapid cool down units, probe station adapters, environmental enclosures, air dryers and dew point monitors.

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